Special Session at DSN

Special Session at DSN
Name:Massive Statistical Process Variations: A Grand Challenge for Testing Nanoelectronic Circuits Place:

Chicago, USA

Venue:4th Workshop on Dependable and Secure Nanocomputing (WDSN)

Links:DSN 2010
Date:

June 28, 2010

Hans-Joachim Wunderlich et al.

Special Session:

  • “Massive statistical process variations: A grand challenge for testing nanoelectronic circuits”
    4th Workshop on Dependable and Secure Nanocomputing (WDSN)
    Session 1 - Opening and Special Focus International Conference on Dependable Systems and
    Networks Workshops (DSN-W) 2010