Special Session at Asian Test Symposium

Special Session at Asian Test Symposium
Name:Testing Nanoelectronic Circuits Under Massive Statistical Process Variations Place:Shanghai, China 

Venue:Asian Test Symposium

Year:

2010

Date:

Dec 1-4, 2010

Links:IEEE Xplore
Hans-Joachim Wunderlich et al.    

Special Session:
  • “Testing Nanoelectronic Circuits Under Massive Statistical Process Variations”
    Special Session at IEEE Asian Test Symposium 2010

Web: http://ieeexplore.ieee.org/xpl/articleDetails.jsp?arnumber=5692298