Special Session:
- “Testing Nanoelectronic Circuits Under Massive Statistical Process Variations”
Special Session at IEEE Asian Test Symposium 2010
Web: http://ieeexplore.ieee.org/xpl/articleDetails.jsp?arnumber=5692298
Special Session at Asian Test Symposium
| Venue: | Asian Test Symposium | Place: | Shanghai, China |
|---|---|---|---|
| Date: | Dec. 1st - 4th, 2010 | Year: | 2010 |
| Links: | IEEE Xplore | ||
Hans-Joachim Wunderlich et al.
Special Session:
Special Session:
