Mini-Workshop on "Abstraction of Device Level Characteristics"
-
Venue:
TU Munich
-
Date:
March 7, 2011
-
Program Chair:
Ulf Schlichtmann
-
Goals and results:
- Timing info under influence of process variation and aging
- Impact of soft errors
- Discussion on next steps on fault modeling
-
Place:
Munich, Germany
-
Year:
2011