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Special Session at Asian Test Symposium

  • Name:Testing Nanoelectronic Circuits Under Massive Statistical Process Variations
  • Venue:Asian Test Symposium

  • Date:

    Dec 1-4, 2010

  • Hans-Joachim Wunderlich et al.    

    Special Session:
    • “Testing Nanoelectronic Circuits Under Massive Statistical Process Variations”
      Special Session at IEEE Asian Test Symposium 2010

    Web: http://ieeexplore.ieee.org/xpl/articleDetails.jsp?arnumber=5692298