June 28, 2010

Hans-Joachim Wunderlich et al.

Special Session:

• “Massive statistical process variations: A grand challenge for testing nanoelectronic circuits”
  4th Workshop on Dependable and Secure Nanocomputing (WDSN)
  Session 1 - Opening and Special Focus International Conference on Dependable Systems and
  Networks Workshops (DSN-W) 2010

Chicago, USA

• DSN 2010