"RASTER: Runtime Adaptive Spatial/Temporal Error Resiliency for Embedded Processors"

  • Author:

    Tuo Li, Muhammad Shafique, Jude Angelo Ambrose, Semeen Rehman, Jörg Henkel, Sri Parameswaran

  • Source:

    50th ACM/EDA/IEEE Design Automation Conference (DAC), Austin, TX, USA

  • Date: Jun. 02 - Jun. 06, 2013