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Awards

Exploiting Program-Level Masking and Error Propagation for Constrained Reliability Optimization

  • Author:

    Muhammad Shafique, Semeen Rehman, Pau Vilimelis Aceituno, Jörg Henkel
  • Source:

    50th ACM/EDA/IEEE Design Automation Conference (DAC), Austin, TX, USA
  • Date: Jun. 02 - Jun. 06, 2013