Exploiting Program-Level Masking and Error Propagation for Constrained Reliability Optimization

Exploiting Program-Level Masking and Error Propagation for Constrained Reliability Optimization
Author:

Muhammad Shafique, Semeen Rehman, Pau Vilimelis Aceituno, Jörg Henkel

Source:

50th ACM/EDA/IEEE Design Automation Conference (DAC), Austin, TX, USA

Date: Jun. 02 - Jun. 06, 2013