Fifth International Workshop on Cross-layer Resiliency (IWCR 2017)

  • Date:

    July 21-22, 2017

  • The objective of the workshop is to discuss reliability issues, state-of the-art, best practices, and innovative solutions to reliability challenges in computer system design. IWCR 2017 will include invited talks by industry experts, short presentations and posters from University researchers (including many whose research was funded by the leading funding agencies in Germany, Japan, UK, and the US), with significant time devoted to in-depth discussions in small breakout groups to identify key technical themes and opportunities for collaborations. We expect more than 100 attendees at the workshop.

    Confirmed Speakers

    Nikil Dutt, UC Irvine, USA

    Jörg Henkel, KIT, Germany

    Ulf Schlichtmann, TU Munich, Germany

    Yiran Chen, Duke University, USA

    Hidetoshi Onodera, Kyoto University, Japan

    Masanori Hashimoto, Osaka University, Japan

    Yongpan Liu, Tsinghua University, China

    Soonhoi Ha, Seoul National University, South Korea

    Naehyuck Chang, KAIST, South Korea

    Yoning Park, Samsung Electronics, South Korea

    Kangwon Lee, SK Telecom, South Korea

    Jaeho Chang, Hyundai Autron, South Korea

    Jooyoung Hwang, Samsung Electronics, South Korea