Dependable Embedded Systems – The SPP 1500 Research Program
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Venue:
JST International Symposium on Dependable VLSI Systems
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Date:
December 1, 2012
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Speaker:
Jörg Henkel
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Abstract:
As Moore’s Law approaches physical limits, though, reliability becomes a severe problem: aging effects like electro migration, NBTI, increased susceptibility against soft errors etc. increasingly jeopardize reliability. The talk gives an overview of the projects within the research program “Dependable Embedded Systems” (German Research Foundation SPP 1500) that tackles the problem from hardware and from software sides.
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Place:
Tokyo, Japan