Data Protection

At DATE 2017

At DATE 2017
Name:

Reliable VLSI Systems

Place:

Lausanne, Switzerland

Venue:

Design, Automation and Test in Europe (DATE 2017)

Site:

https://www.date-conference.com/date17/conference/tutorial-m10

Date:

March 27, 2017

Project Leader:

Jörg Henkel, et al.

Speaker:

Jörg Henkel, Norbert Wehn, Marilyn Wolf

Reliability is a key concern for many growing semiconductor markets, including automotive, medical, and industrial IoT. Consumer electronics markets have traditionally had low reliability requirements due to the high turnover of products. Chips built for these emerging markets must operate at high levels of confidence and must provide long lifetimes. This tutorial will give a holistic view of reliability, including physical effects, system-level models, and applications. The speakers will discuss reliability models and their influence on system design; DRAM and wireless communication systems; and statistical modeling of thermal behavior.