Dark Silicon as a Reliability Challenge

Dark Silicon as a Reliability Challenge
Venue:The 32nd IEEE International Conference on Computer Design (ICCD) Place:

Seoul, Korea

Date:

October 19-22, 2014

Speaker:Jörg Henkel

Abstract

Dependability has become a major design concern as device scaling approaches its limits. Smaller feature sizes lead to higher susceptibility to soft errors, higher process variability and to an accelerated aging of devices. The latter is directly related to temperature, which in fact is responsible for various causes of aging effects like electro migration, NBTI etc. And high on-chip temperature, through high power densities, will enforce to keep some on-chip components idle or at least to prohibit operating them simultaneously at full speed. That is also called “Dark Silicon”. The talk starts by giving an introduction to various reliability jeopardizing effects like aging, the impact temperature has on these and the discontinuation of Dennard Scaling. After presenting the newest research results on the inter-relationship between aging effects, the talk focuses on various techniques to enhance dependability of on-chip systems in the upcoming dark silicon era.

Bio

Prof. Dr. Jörg Henkel is currently with Karlsruhe Institute of Technology (KIT), Germany, where he is directing the Chair for Embedded Systems CES. Before, he was a Senior Research Staff Member at NEC Laboratories in Princeton, NJ. He received his PhD from Braunschweig University with "Summa cum Laude". Prof. Henkel has/is organizing various embedded systems and low power ACM/IEEE conferences/symposia as General Chair and Program Chair and was a Guest Editor on these topics in various Journals like the IEEE Computer Magazine. He was Program Chair of CODES'01, RSP'02, ISLPED’06, SIPS'08 and CASES'09, Estimedia'11, VLSI Design'12, ICCAD’12, PATMOS’13, NOCS’14 and served as General Chair for CODES'02, ISLPED’09 and Estimedia’12, ICCAD’13. He is/has been a steering committee member of major conferences in the embedded systems field like at ICCAD, ISLPED, Codes+ISSS, CASES and is/has been an editorial board member of various journals like the IEEE TVLSI, IEEE TCAD, JOLPE etc. In recent years, Prof. Henkel has given several keynotes at various international conferences primarily with focus on embedded systems dependability. He has given full/half-day tutorials at leading conferences like DAC, ICCAD, DATE etc. Prof. Henkel received the 2008 DATE Best Paper Award, the 2009 IEEE/ACM William J. Mc Calla ICCAD Best Paper Award, the Codes+ISSS 2011 Best Paper Award and the MaXentric Technologies AHS 2011 Best Paper Award as well as the DATE 2013 Best IP Award and the DAC 2014 Designer Track Best Poster Award. He is the Chairman of the IEEE Computer Society, Germany Section, and was the Editor-in-Chief of the ACM Transactions on Embedded Computing Systems (ACM TECS) for two consecutive terms. He is an initiator and the coordinator of the German Research Foundation's (DFG) program on 'Dependable Embedded Systems' (SPP 1500). He is the site coordinator (Karlsruhe site) of the Three- University Collaborative Research Center on "Invasive Computing" (DFG TR89). Since 2012 he is an elected Board Member of the German Research Foundation’s (DFG) board on “Computer Architecture and Embedded Systems. He holds ten US patents.