Mini-Workshop on "Abstraction of Device Level Characteristics"

Mini-Workshop on "Abstraction of Device Level Characteristics"
Venue:

TU Munich

Place:

Munich, Germany

Date:

March 7, 2011

Year:

2011

Program Chair:

Ulf Schlichtmann

Goals and results:

  • Timing info under influence of process variation and aging
  • Impact of soft errors
  • Discussion on next steps on fault modeling